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Printable version PDF-format version

Atomic Force Microscopes - Tutorial Page

 

Measuring images with an atomic force microscope

  • Place a probe in the microscope and align the light lever sensing system.
  • With the X-Y sample and the optical microscope place the region of the sample that will be imaged directly under the AFM probe.
  • Engage the Z translation stage to bring the probe to the surface.
  • Start the scanning of the probe over the surface and view the image of the surface on the computer screen.
  • Save the image on a computer disk.
 
 
 
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