Nano-DST™

Introduction

The Nano-DST™ is an advanced, high performance, Atomic Force Microscope designed for the most demanding research applications. This complete AFM system includes advanced control software, a high performance electronic controller, a versatile stage, and an available vibration solution. The system is constructed from the highest quality components assuring mimimal service repair and a long product lifetime.

Advanced features of the Nano-DST™ are:

Dual Scanner Control (DST): Two scanners can be driven individually or simultaneously in the Nano-DST™, to perform rapid scanning, panning, and achieve the highest resolution possible.

Modular Electronic Controller: Because the Nano- DST™ electronic controller is modular, it can be configured for an endless number of experiments and applications.

Flexure Scanner with 3-D Calibration Sensors: With the proprietary flexure scanner design, the most accurate and precise data is measurable with the Nano- DST™. Optional scan ranges as high as 350 microns are possible.

Advanced Specifications: 24 bit scan control as well as a 400 MHz, low noise, high stability modulation electronics assures the highest performance specifications available in an SPM system.

Designed for modes: With the Nano-DST™ all AFM modes may be implemented including SThM, MFM, EFM, STM, SKPM... Support is provided by Pacific Nanotechnology for customers that want to experiment with new modes.

Motorized Stage Control: The Nano-DST™ stage includes seven stepper motors that control the sample position, optics zoom, and focus. Z axis motion control, with 3 motors, facilitates rapid probe approach as well as enables control of the probe/sample angle. All motors are operated by our new high speed motor controller.

Nano-DST™ Stage

The Nano-DST™ stage is constructed with the highest quality precision granite that includes a base and a gantry. The entire video optical microscope and light lever AFM scanner are supported by the gantry. The stage is designed to maximize stability so that low noise measurements are possible. Additionally, the Nano-DST™ stage is very flexible to allow not only basic scanning but additional types of experiments.

Nano Flex™ Light Lever AFM (LL-AFM):

The LL-AFM scanner incorporates a high performance flexure scanner that gives superior scanning specifications including linearity, crosstalk, and bow. Combined with the XYZ calibration sensors, reliable and accurate measurements are possible. Probes are held in place with the magnetic probe holder for mounted probes. A clip mount is available for unmounted probes. Stray light is minimized with the tightly focused laser, which reduces unwanted artifacts in images. With the high bandwidth, four quadrant photo-detector, it is possible to make high frequency vibrating mode measurements as well as frictional force measurements. The scanner includes connectors for modes that require direct electrical contact to the probe.

High Speed Sample (HSS) Rapid Scanner:

A four-quadrant high-resonance tube scanner is provided for rapid scanning. The HSS rapid scanner is mounted in the Nano-DST™ stage below the LL-AFM scanner in a puck. It may be replaced with the mutilayer sample puck and/or environmental cell, or other sample holding option. The LL-AFM scanner may be used to “pan” over a sample while rapid scanning (see Figure 3).

Probe Exchange Mechanism:

Probe exchange in the Nano-DST™ is facilitated with the flip-up scanner mechanism. The mechanism is locked into place with two easy access locks at the front of the LL-AFM scanner. Combined with the automated stage and software, probe exchange takes only a few minutes. Because the scanner is always firmly attached to the stage, the scanner can not be accidentally damaged (see Figure 4).

Sample Puck:

A removable sample puck supports the sample while scanning with the LL-AFM scanner. The very flexible puck has several removable plates that allow samples of many thicknesses to be scanned. Samples may be held in place magnetically or with an adhesive tape. The puck may be readily replaced with an environmental cell, a rapid scanner, or even a sample heating stage (see Figure 5).

XY Positioning Stage:

Moving a sample relative to the AFM scanner is possible with the motorized XY translation mechanism. The automated stage is designed such that the sample holding puck is in direct mechanical contact with the granite base. High performance microcontroller electronics control the high resolution stepper motors in the stage. The stage motions may be activated by a track ball, mouse, or software algorithm. Under automation, step and repeat scanning is possible (see Figure 6).