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The Nano-R™ Atomic Force Microscope

 

Nano-R™ AFM

The Nano-R™ is a general purpose atomic force microscope (AFM) for making routine images on structures with nanometer sized features. Because the Nano-R™ can be used with two versions of image acquisition software, X'Pert™ software and EZMode™, it is optimized for novices, casual users, and routine users. Further, the Nano-R™ is supplied with the most commonly used AFM modes including contact, lateral force, material sensing, non-contact and close contact mode. The three primary subsystems of the Nano-R™ AFM are the master computer, a control unit, and the Nano-R™ stage.
Nano-R™ Atomic Force Microscope Enlarged
The Pacific Nanotechnology Nano-R™ AFM sets a new standard in atomic force microscopy for nanotechnology, nanoscience and nanoinspection applications. It is designed to make the highest quality images and measurements of materials and structures with nanometer scale dimensions. The Nano-R™ is ideal for both independent researchers and for research teams that want to share an AFM.
 
 
 
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