Santa Clara, CA -- November 25, 2002 -- Pacific Nanotechnology, Inc. (PNI) has
published a guide to recognizing image artifacts produced by an atomic force
microscope (AFM). The PNI "Guide to AFM Image Artifacts" can be viewed and
downloaded
as a PDF (portable document format) file. The addition of this guide to PNI's
web site underscores the company's mission to facilitate the growth and
expansion of nanotechnology efforts by providing the tools and instructions
that any researcher can use.
Images produced by an AFM can have "artifacts," distortions and spurious
features caused by the manner in which the image is produced. The 12-page
full-color document, illustrated by 27 figures, describes and illustrates
artifact examples caused by the probe tip, scanner, image processing software,
vibration, contamination, electronics, and the vacuum chuck. Users can then
recognize and take steps to avoid or minimize common image distortions and
artifacts. Contact lara@technicalmarketing.com for an example AFM image
artifact.
PNI is the global leader in high-performance, easy-to-use, affordable AFMs
for nano-scale research and manufacturing. The company is facilitating the
growth and expansion of nanotechnology and the manufacture of nano-scale
products by providing practical AFM tools for new or experienced and
single- or multi-user environments. For more information, visit the
company's website at www.pacificnanotech.com.
