Company News & Events

"Guide to AFM Image Artifacts" can be viewed or downloaded from PNI's web site to aid nanotechnologists in recognizing and minimizing these common image distortions.

Santa Clara, CA -- November 25, 2002 -- Pacific Nanotechnology, Inc. (PNI) has published a guide to recognizing image artifacts produced by an atomic force microscope (AFM). The PNI "Guide to AFM Image Artifacts" can be viewed and downloaded as a PDF (portable document format) file. The addition of this guide to PNI's web site underscores the company's mission to facilitate the growth and expansion of nanotechnology efforts by providing the tools and instructions that any researcher can use.

Images produced by an AFM can have "artifacts," distortions and spurious features caused by the manner in which the image is produced. The 12-page full-color document, illustrated by 27 figures, describes and illustrates artifact examples caused by the probe tip, scanner, image processing software, vibration, contamination, electronics, and the vacuum chuck. Users can then recognize and take steps to avoid or minimize common image distortions and artifacts. Contact lara@technicalmarketing.com for an example AFM image artifact.

PNI is the global leader in high-performance, easy-to-use, affordable AFMs for nano-scale research and manufacturing. The company is facilitating the growth and expansion of nanotechnology and the manufacture of nano-scale products by providing practical AFM tools for new or experienced and single- or multi-user environments. For more information, visit the company's website at www.pacificnanotech.com.